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  1. Vlsi Test Principles And Architectures (Inbunden)

    av

    Laung-terng Wang, Cheng-wen Wu, Xiaoqing Wen

    ISBN: 9780123705976 - UTGIVEN: 2006-08-14

    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
    - Most up-to-date coverage of design for testability.
    - Cove[...]

    Jämför priser
    från 515.00 kr