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  1. Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem (Inbunden)

    av

    Ray Egerton, R. Egerton

    ISBN: 9780387258003 - UTGIVEN: 200508

    Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc[...]

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    från 904.00 kr