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  1. Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (Häftad)

    av

    Joseph Goldstein, Patrick Echlin, Dale E. Newbury, Joseph Goldstein, David C. Joy, David C. Joy

    ISBN: 9781461349693 - UTGIVEN: 2013-10

    Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of studentsand practitioners whose backgrounds span a wide range of s[...]

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    från 801.00 kr