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  1. Thin Film Analysis by X-Ray Scattering (Inbunden)

    av

    Mario Birkholz

    ISBN: 9783527310524 - UTGIVEN: 200601

    With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t[...]

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    från 1580.00 kr